Wafer & Substrate Probe Stations & Accessories

For 4”, 6”, 8” and 12” wafer

·Stable probe station can reduce expendables used and prevent wafer scraped

·Failure Analysis, Reliability, Device characterization, Wafer Acceptance Test, Quality

Assurance and general purpose probing

·Five levels configurations to choose from Manual, Motorized, Joystick programmable, Software prog   rammable and Semi-Automatic.

·Can upgrade when you need, and just upgrade in your LAB

·High performance thermal chuck system. The fastest transition times in the industry

·Coolant temperature never exceeds 20°C. Temperature ranges as high as 600°C

·Board mount chuck for mount various boards with test sockets

·Deep Sub-micron, Resolution Probe Positioner 800 TPI