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高频差分多模探头

高频差分多模探头

40 GHz Differential Probe § Fully Balanced 100 Ω Differential Signals without Ground Contact § Adaptable to 50 Ω Single Ended Input Impedance

Measure S2p, S4p S-parameters using configurable Ground Collars

Adjustable Signal Probe Pitch (from 450um to >1.7mm)

4-6um Conductive Diamond Plated Probe Tips for repeatable measurements

~3.5ps Fall Time Degradation

Universal Probe Design: use as Hand Probe or Mount in Micro-positioners

Full Set of Probe Pitch Calibration Accessories

Time Domain Measurements

100 Ω Impedance measurements on PCBs, cables, backplanes, daughter-cards and connectors.

Use 50 Ω mode for high resolution Failure Analysis with ~1mm fault Isolation

Frequency Domain Measurements

Extract Differential TDR/TDT Measurements for Creating Return-Loss and Insertion-Loss S-Parameters

Use 40 GHz VNA or TDR/T to make two or four-port Multi-Mode S-Parameters Measurements (requires ground collar adapter).

o DVT40-1MM-L Ground/Signal pin Configurations: GSGSG, GSSG, SGS,GSS, SSG

o DVT40-1MM-H Ground pin can be inserted in front or behind Signal

o de-embedding 4 port S-Parameters to improve measurement accuracy