Introspect M5512 GDDR7 DRAM存储测试系统
M5512－用于GDDR7 DRAM特性测试和验证的ATE设备
M5512 GDDR7 DRAM存储测试系统是一种基于JEDEC图形双数据速率7 SGRAM标准（GDDR7）的内存集成电路特性和功能测试的类别创建解决方案。该解决方案具有高速，双向PAM3信令，低速NRZ信令和完整的协议培训能力，是帮助将下一代图形存储器带入行业的最佳工具。
主要特点：
• Complete memory testing: connects to all channels in a single graphics memory IC, thus providing test coverage on all pins 
• Programmable device power supplies: precision programming of the power up and power down sequence of the memory IC under test
• Superior signal integrity: world-class pinelectronics running at 40 Gbps in PAM3 mode 
• AC characterization: picosecond resolution timing and mV resolution shmoo capability
主要优势:
• Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications 
• Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pinelectronics exceed the requirements of the GDDR7 specifications 
• Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards

Introspect M5512 GDDR7 DRAM存储测试系统

Introspect M5512 GDDR7 DRAM存储测试系统

Introspect M5512 GDDR7 DRAM存储测试系统Introspect M5512 GDDR7 DRAM存储测试系统


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